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Other Documents

Reliability of BST Thin Film Capacitors
"Integrity, Reliability, and Failure. Challenges and opportunities". Editors:J.F. Silva Gomes and Shaker A. Meguid, 2009, ISBN: 978-972-8826-22-2, INERGI, 2009, p. 135-136.

 
 
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PARATEK NEWS

Paratek nominated for GSMA Innovation Award

Cellular Industry Veteran Ralph Pini Joins Paratek

Paratek and STMicroelectronics to Jointly Develop & Market Tunable RF Technology

Please e-mail us to request our new Passive Tunable IC Sample/ Demonstration Kit

Click here to watch a brief demo video of AIMM!

Click here for more information on our Adaptive Impedance Matching Module. 
 

 
 
             
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